Semiconductor Reliability Quality and Reliability-1
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چکیده
منابع مشابه
On the Monitoring of Simple Linear Berkson Profiles
We consider the quality of a process, which can be characterized by a simple linear Berkson profile. One existing approach for monitoring the simple linear profile and two new proposed schemes are studied for charting the simple linear Berkson profile. Simulation studies demonstrate the effectiveness and efficiency of one of the proposed monitoring schemes. In addition, a systematic diagnostic ...
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